Resistance switching in electrodeposited polycrystalline Fe3O4 films

被引:8
|
作者
Gudavarthy, Rakesh V.
Miller, Andrew S.
Bohannan, Eric W.
Kulp, Elizabeth A.
He, Zhen
Switzer, Jay A. [1 ]
机构
[1] Missouri Univ Sci & Technol, Dept Chem, Rolla, MO 65409 USA
关键词
Electrodeposition; Data storage; Magnetite; Resistance switching; EPITAXIAL ELECTRODEPOSITION; TRANSITION; MAGNETITE;
D O I
10.1016/j.electacta.2011.02.032
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Resistance random access memory (RRAM) is an emerging nonvolatile memory that offers advantages of scalability, fast switching, and low voltages. Magnetite, Fe3O4, has been shown to exhibit resistance switching in nanoscale architectures such as superlattices. Here, we show that electrodeposited polycrystalline films of Fe3O4 exhibit multistate resistance switching. Experiments suggest that the insulator-to-metal transition may be facilitated by the presence of a thin nano-crystalline layer which is critical for resistance switching to occur at lower bias. We also show that the switching behavior can be tuned through the applied deposition potential. The multiple resistance states accessible in these simple architectures open up new possibilities for multi-bit data storage and retrieval. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:10550 / 10556
页数:7
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