Bilateral comparison of 10 pF and 100 pF standards (ongoing BIPM key comparisons BIPM.EM-K14.a and 14.b) between the NIS (Egypt) and the BIPM

被引：0
作者：
Gournay, Pierre [1 ]
Helmy, M. [2 ]
Raouf, A. [2 ]
Hamed, Heba A. M. [2 ]
Gad, A. Eliwa [2 ]
机构：
[1] BIPM, Pavillon Breteuil,12 Bis Grande Rue, F-92312 Sevres, France
[2] NIS, Tersa St,POB 136, Giza 12211, Egypt
来源：
METROLOGIA | 2017年 / 54卷
关键词：
D O I：
10.1088/0026-1394/54/1A/01008
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
[No abstract available]
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页数：3
相关论文
共 2 条
  • [1] Protocol for BIPM on-going key comparisons of 10 pF and 100 pF capacitance standards
  • [2] Delahaye F., Goebel R., Evaluation of the frequency dependence of the resistance and capacitance standards in the BIPM quadrature bridge, IEEE. Trans. Instrum. Meas, 54, 2, pp. 533-537, (2005)
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