Application of X-ray Diffraction at the Study on the Preparation and Structure of α-Al2O3 Nanocrystal

被引:0
作者
Li Jing [1 ]
Pan Baowu [1 ]
机构
[1] N China Univ, Sch Mat Sci & Engn, Taiyuan 030051, Peoples R China
来源
TESTING AND EVALUATION OF INORGANIC MATERIALS I | 2011年 / 177卷
关键词
X-ray diffraction; Nanocrystal; Preparation; Structure;
D O I
10.4028/www.scientific.net/AMR.177.41
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
alpha-Al(2)O(3) nanocrystalline powder was prepared via precipitation method, and the effect of reactant concentration on the nanocrystal structure was investigated by X-Ray diffraction. Firstly, alpha-Al(2)O(3) phase was analyzed by continuous scanning, first strong peaks of all alpha-Al(2)O(3) phase were step scanned then to determinate the most perfect crystal structure, and the crystal lattice constants and average crystal size of the best crystal structure were calculated finally. The result showed that X-ray diffraction was an elementary and necessary means for the crystal structure study, it also offered a new way to select preparation process, and the application of it would develop along with the develop of new materials. The most perfect alpha-Al(2)O(3) nanocrystal structure was obtained with the reactant solution of 0.65mol/L, and its lattice constants were a-4.746xc-12.917 angstrom and the average crystal size was 59nm.
引用
收藏
页码:41 / 44
页数:4
相关论文
共 2 条
[1]   Evaluation of paracrystalline lattice distortion by profile analysis using a single X-ray diffraction peak [J].
Yamamura, S ;
Momose, Y ;
Terada, K ;
Fukuoka, E .
INTERNATIONAL JOURNAL OF PHARMACEUTICS, 1996, 133 (1-2) :117-125
[2]  
顾燕芳, 1992, [华东理工大学学报. 自然科学版, Journal of East China University of Science and Technoloy. Natural Sciences Edition], V18, P511