Thermoluminescence of chip inductors from mobile phones for retrospective and accident dosimetry

被引:40
作者
Fiedler, I. [1 ]
Woda, C. [1 ]
机构
[1] Helmholtz Zentrum Munchen, German Res Ctr Environm Hlth, Inst Radiat Protect, D-85764 Neuherberg, Germany
关键词
Retrospective dosimetry; Emergency dosimetry; Electronic devices; Alumina rich inductors; Thermoluminescence;
D O I
10.1016/j.radmeas.2011.05.077
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
Electronic components in portable electronic devices such as mobile phones and portable media player have previously been shown to be useful tools for retrospective and accident dosimetry. In this study the properties of alumina rich inductors removed from mobile phones are investigated using thermoluminescence (TL). The typical glow curve of this component has two main peaks at 170 and 270 degrees C. With a suitable measurement protocol sensitivity changes of both peaks could be corrected so that the TL signal shows a linear increase in the investigated dose range from 100 mGy to 5 Gy. All inductors studied showed essentially no signal for zero dose. We investigated the fading of the TL signals and the detection limit of inductors extracted from different mobile phones. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1862 / 1865
页数:4
相关论文
共 12 条
  • [1] Aitken M.J., 1985, Thermoluminescence Dating, P359
  • [2] Thermoluminescence dosimetry of electronic components from personal objects
    Beerten, Koen
    Woda, Clemens
    Vanhavere, Filip
    [J]. RADIATION MEASUREMENTS, 2009, 44 (5-6) : 620 - 625
  • [3] The use of a portable electronic device in accident dosimetry
    Beerten, Koen
    Vanhavere, Filip
    [J]. RADIATION PROTECTION DOSIMETRY, 2008, 131 (04) : 509 - 512
  • [4] BREEN BN, ACCU L MULTILAYER IN
  • [5] Telephone chip-cards as individual dosemeters
    Göksu, HY
    [J]. RADIATION MEASUREMENTS, 2003, 37 (06) : 617 - 620
  • [6] Optically stimulated luminescence of electronic components for forensic, retrospective, and accident dosimetry
    Inrig, E. L.
    Godfrey-Smith, D. I.
    Khanna, S.
    [J]. RADIATION MEASUREMENTS, 2008, 43 (2-6) : 726 - 730
  • [7] Fading corrections to electronic component substrates in retrospective accident dosimetry
    Inrig, E. L.
    Godfrey-Smith, D. I.
    Larsson, C. L.
    [J]. RADIATION MEASUREMENTS, 2010, 45 (3-6) : 608 - 610
  • [8] Radiation sensitivity of memory chip module of an ID card
    Mathur, V. K.
    Barkyoumb, J. H.
    Yukihara, E. G.
    Goeksu, H. Y.
    [J]. RADIATION MEASUREMENTS, 2007, 42 (01) : 43 - 48
  • [9] The single aliquot regenerative dose protocol: potential for improvements in reliability
    Murray, AS
    Wintle, AG
    [J]. RADIATION MEASUREMENTS, 2003, 37 (4-5) : 377 - 381
  • [10] Woda C, INFLUENCE PREH UNPUB