The importance of imaging conditions in scanning tunneling microscopy for the determination of surface texture and roughness

被引：9

作者：

Aguilar, M

Oliva, AI

Anguiano, E

机构：

[1] CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain

[2] Univ Autonoma Madrid, Escuela Tecn Super Informat, Madrid 28049, Spain

来源：

SURFACE SCIENCE | 1999年 / 420卷 / 2-3期

关键词：

metallic surfaces; scanning tunneling microscopy; surface roughening; surface structure; morphology; roughness and; topography;

D O I：

10.1016/S0039-6028(98)00841-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We show that the control conditions in the feedback loop of a scanning tunneling microscope (STM) affect the values of the surface texture parameters, including fractal characterization, when they are calculated from STM images of the surface. The main surface texture parameters (such as the r.m.s. roughness, kurtosis, skewness, and average wavelength) show a strong dependence on the conditions used in the feedback loop for imaging. Fractal character changes also with feedback parameters. The quality of the STM images can be measured quantitatively by using some of the surface texture parameters. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：275 / 284

页数：10

共 27 条

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