Ellipsometry for measurement of complex dielectric permittivity in millimeter-wave region

被引：2
|
作者：
Tsuzukiyama, K [1 ]
Sakai, T [1 ]
Yamazaki, T [1 ]
Hashimoto, O [1 ]
机构：
[1] Mitsui Chem INC, Sodegaura, Chiba 2990265, Japan
来源：
33RD EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3, CONFERENCE PROCEEDINGS | 2003年
关键词：
D O I：
10.1109/EUMA.2003.340996
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The ellipsometry method is extended to a measurement for complex permittivities of materials in millimeter-wave region. We propose an effective technique based on the Fourier analysis method to eliminate an uncertainty due to the free-space method. Complex permittivities can be measured with a high degree of accuracy by the improved ellipsometry method, as named Fourier Analysis Correction Ellipsometry (FACE) Method.
引用
收藏
页码：487 / 490
页数：4
相关论文
共 50 条
  • [1] Free-Space Measurement of the Complex Permittivity of Liquid Materials at Millimeter-wave Region
    Kang, Tae-Weon
    Kim, Jeong-Hwan
    Lee, Dong-Joon
    Kang, No-Weon
    2016 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2016), 2016,
  • [2] Measurement of complex permittivity of dielectric materials in millimeter wave region by whispering gallery mode method
    Tamura, H
    Kogami, Y
    Matsumura, K
    APMC 2001: ASIA-PACIFIC MICROWAVE CONFERENCE, VOLS 1-3, PROCEEDINGS, 2001, : 1223 - 1226
  • [3] Millimeter-wave measurement of complex permittivity using dielectric rod resonator excited by NRD-guide
    Nakayama, A
    Fukuura, A
    Nishimura, M
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2003, 51 (01) : 170 - 177
  • [4] DETERMINATION OF THE COMPLEX DIELECTRIC PERMITTIVITY OF ICE IN THE MILLIMETER-WAVE RANGE BY THE RESONATOR METHOD
    Kirichenko, A. Ya.
    Kogut, A. E.
    Kutuzov, V. V.
    Solodovnik, V. A.
    UKRAINIAN JOURNAL OF PHYSICS, 2007, 52 (05): : 511 - 514
  • [5] MILLIMETER-WAVE DIELECTRIC MEASUREMENT OF MATERIALS
    AFSAR, MN
    BUTTON, KJ
    PROCEEDINGS OF THE IEEE, 1985, 73 (01) : 131 - 153
  • [6] A Novel Parallel-Plate Dielectric Resonator Method for Broadband Complex Permittivity Measurement in the Millimeter-Wave Bands
    Yu, Chengyong
    Qiao, Man
    Gao, Chong
    Zhang, Yunpeng
    Gao, Yong
    Zheng, Hu
    Li, En
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2023, 71 (06) : 2488 - 2497
  • [7] Millimeter-Wave Measurement of Complex Permittivity by Perturbation Method Using Open Resonator
    Suzuki, Hirosuke
    Kamijo, Toshio
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2008, 57 (12) : 2868 - 2873
  • [8] MEASUREMENT OF THE COMPLEX PERMITTIVITY OF LOW LOSS POLYMER POWDERS IN THE MILLIMETER-WAVE RANGE
    Kapilevich, Boris
    Litvak, Boris
    Wainstein, Vladimir
    Moshe, Danny
    JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY, 2007, 40 (03) : 186 - 192
  • [9] Numerical Simulation of Ellipsometry Measurement in Millimeter-Wave Band
    Yang Xianwang
    Ji Minning
    Li Mingxiang
    2008 CHINA-JAPAN JOINT MICROWAVE CONFERENCE (CJMW 2008), VOLS 1 AND 2, 2008, : 662 - +
  • [10] Millimeter-wave permittivity measurement of deposited dielectric films using the spherical open resonator
    Dudorov, SN
    Lioubtchenko, DV
    Mallat, JA
    Räisänen, AV
    IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2005, 15 (09) : 564 - 566
12345