Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography

被引：31
作者：
Cazac, V. [1 ]
Meshalkin, A. [1 ]
Achimova, E. [1 ]
Abashkin, V. [1 ]
Katkovnik, V. [2 ]
Shevkunov, I. [2 ,3 ]
Claus, D. [4 ]
Pedrini, G. [4 ]
机构：
[1] Moldavian Acad Sci, Inst Appl Phys, Kishinev, Moldova
[2] Tampere Univ Technol, Dept Signal Proc, Tampere, Finland
[3] St Petersburg State Univ, St Petersburg, Russia
[4] Univ Stuttgart, Inst Tech Opt, Stuttgart, Germany
来源：
APPLIED OPTICS | 2018年 / 57卷 / 03期
基金：
芬兰科学院;
关键词：
WAVE-GUIDES; PHASE RETRIEVAL; RECONSTRUCTION;
D O I：
10.1364/AO.57.000507
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Surface relief gratings and refractive index gratings are formed by direct holographic recording in amorphous chalcogenide nanomultilayer structures As2S3-Se and thin films As2S3. The evolution of the grating parameters, such as the modulation of refractive index and relief depth in dependence of the holographic exposure, is investigated. Off-axis digital holographic microscopy is applied for the measurement of the photoinduced phase gratings. For the high-accuracy reconstruction of the wavefront (amplitude and phase) transmitted by the fabricated gratings, we used a computational technique based on the sparse modeling of phase and amplitude. Both topography and refractive index maps of recorded gratings are revealed. Their separated contribution in diffraction efficiency is estimated. (C) 2018 Optical Society of America
引用
收藏
页码：507 / 513
页数：7
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