Note: Vector reflectometry in a beam waveguide

被引：11

作者：

Eimer, J. R. ^{[1
,2
]}

Bennett, C. L. ^{[2
]}

Chuss, D. T. ^{[1
]}

Wollack, E. J. ^{[1
]}

机构：

[1] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA

[2] Johns Hopkins Univ, Dept Phys & Astron, Baltimore, MD 21218 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2011年 / 82卷 / 08期

基金：

美国国家科学基金会;

关键词：

MEASUREMENT SYSTEM; NETWORK ANALYZER; CALIBRATION; DESIGN;

D O I：

10.1063/1.3622522

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present a one-port calibration technique for characterization of beam waveguide components with a vector network analyzer. This technique involves using a set of known delays to separate the responses of the instrument and the device under test. We demonstrate this technique by measuring the reflected performance of a millimeter-wave variable-delay polarization modulator. (C) 2011 American Institute of Physics. [doi:10.1063/1.3622522]

引用

页数：3

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