Simulation of the evolution of fused silica's surface defect during wet chemical etching

被引:0
作者
Liu, Taixiang [1 ]
Yang, Ke [1 ]
Li, Heyang [1 ]
Yan, Lianghong [1 ]
Yuan, Xiaodong [1 ]
Yan, Hongwei [1 ]
机构
[1] CAEP, Res Ctr Laser Fus, Mianyang, Peoples R China
来源
PACIFIC RIM LASER DAMAGE 2017-OPTICAL MATERIALS FOR HIGH-POWER LASERS | 2017年 / 10339卷
基金
中国国家自然科学基金;
关键词
Fused silica; surface defect; wet chemical etching; morphological evolution; finite-difference time-domain simulation; DAMAGE; FACILITY;
D O I
10.1117/12.2269510
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Large high-power-laser facility is the basis for achieving inertial confinement fusion, one of whose missions is to make fusion energy usable in the near future. In the facility, fused silica optics plays an irreplaceable role to conduct extremely high-intensity laser to fusion capsule. But the surface defect of fused silica is a major obstacle limiting the output power of the large laser facility and likely resulting in the failure of ignition. To mitigate, or event to remove the surface defect, wet chemical etching has been developed as a practical way. However, how the surface defect evolves during wet chemical etching is still not clearly known so far. To address this problem, in this work, the three-dimensional model of surface defect is built and finite difference time domain (FDTD) method is developed to simulate the evolution of surface defect during etching. From the simulation, it is found that the surface defect will get smooth and result in the improvement of surface quality of fused silica after etching. Comparatively, surface defects (e.g. micro-crack, scratch, series of pinholes, etc.) of a typical fused silica at different etching time are experimentally measured. It can be seen that the simulation result agrees well with the result of experiment, indicating the FDTD method is valid for investigating the evolution of surface defect during etching. With the finding of FDTD simulation, one can optimize the treatment process of fused silica in practical etching or even to make the initial characterization of surface defect traceable.
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页数:9
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