Thermal management of AlGaN-GaNHFETs on sapphire using flip-chip bonding with epoxy underfill

被引:86
作者
Sun, J [1 ]
Fatima, H
Koudymov, A
Chitnis, A
Hu, X
Wang, HM
Zhang, J
Simin, G
Yang, J
Khan, AA
机构
[1] Univ S Carolina, Dept Elect Engn, Columbia, SC 29208 USA
[2] SET Inc, Columbia, SC 29209 USA
关键词
epoxy underfill; flip chip; GaNAlGaN; HFETs; thermal impedance;
D O I
10.1109/LED.2003.813362
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Self-heating imposes the major limitation on the output power of GaN-based HFETs on sapphire or SiC. SiC substrates allow for a simple device thermal management scheme; however, they are about a factor 20-100 higher in cost than sapphire. Sapphire substrates of diameters exceeding 4 in are easily available but the heat removal through the substrate is inefficient due to its low thermal conductivity. The authors demonstrate that the thermal impedance of GaN based HFETs over sapphire substrates can be significantly reduced by implementing flip-chip bonding with thermal conductive epoxy,underfill. They also show that in sapphire-based flip-chip mounted devices the heat spread from the active region under the gate along the GaN buffer and the substrate is the key contributor to the overall thermal impedance.
引用
收藏
页码:375 / 377
页数:3
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