Simulation-based Fault Injection with QEMU for Speeding-up Dependability Analysis of Embedded Software

被引:16
|
作者
Ferraretto, Davide [1 ]
Pravadelli, Graziano [1 ]
机构
[1] Univ Verona, Dept Comp Sci, I-37100 Verona, Italy
来源
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2016年 / 32卷 / 01期
关键词
Fault injection; Dependability analysis; Dynamic binary translation;
D O I
10.1007/s10836-015-5555-z
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Simulation-based fault injection (SFI) represents a valuable solution for early analysis of software dependability and fault tolerance properties before the physical prototype of the target platform is available. Some SFI approaches base the fault injection strategy on cycle-accurate models implemented by means of Hardware Description Languages (HDLs). However, cycle-accurate simulation has revealed to be too time-consuming when the objective is to emulate the effect of soft errors on complex microprocessors. To overcome this issue, SFI solutions based on virtual prototypes of the target platform have started to be proposed. However, current approaches still present some drawbacks, like, for example, they work only for specific CPU architectures, or they require code instrumentation, or they have a different target (i.e., design errors instead of dependability analysis). To address these disadvantages, this paper presents an efficient fault injection approach based on QEMU, one of the most efficient and popular instruction-accurate emulator for several microprocessor architectures. As main goal, the proposed approach represents a non intrusive technique for simulating hardware faults affecting CPU behaviours. Permanent and transient/intermittent hardware fault models have been abstracted without losing quality for software dependability analysis. The approach minimizes the impact of the fault injection procedure in the emulator performance by preserving the original dynamic binary translation mechanism of QEMU. Experimental results for both x86 and ARM processors proving the efficiency and effectiveness of the proposed approach are presented.
引用
收藏
页码:43 / 57
页数:15
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