Transport and noise characteristics of submicron high-temperature superconductor grain-boundary junctions

被引：24
作者：
Herbstritt, F
Kemen, T
Alff, L
Marx, A
Gross, R
机构：
[1] Univ Cologne, Inst Phys 2, D-50937 Cologne, Germany
[2] Walther Meissner Inst Tieftemp Forsch, D-85748 Garching, Germany
来源：
APPLIED PHYSICS LETTERS | 2001年 / 78卷 / 07期
关键词：
D O I：
10.1063/1.1343847
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have investigated the transport and noise properties of submicron YBa2Cu3O7-delta bicrystal grain-boundary junctions prepared using electron beam lithography. The junctions show an increased conductance for low voltages reminiscent of Josephson junctions having a barrier with high transmissivity. The voltage noise spectra are dominated by a few Lorentzian components. At low temperatures clear two-level random telegraph switching signals are observable in the voltage versus time traces. We have investigated the temperature and voltage dependence of individual fluctuators both from statistical analysis of voltage versus time traces and from fits to noise spectra. A transition from tunneling to thermally activated behavior of individual fluctuators was clearly observed. The experimental results support the model of charge carrier traps in the barrier region. (C) 2001 American Institute of Physics.
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页码：955 / 957
页数：3
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