Structural and optical studies of CdS nanocrystals embedded in silicon dioxide films

被引:26
作者
Rolo, AG
Conde, O
Gomes, MJM
机构
[1] Univ Minho, Dept Fis, P-4709 Braga, Portugal
[2] Univ Lisbon, Dept Fis, P-1700 Lisbon, Portugal
关键词
CdS-doped glass films; II-VI semiconductor; Rf-sputtering; quantum dots; optical absorption; photoluminescence;
D O I
10.1016/S0040-6090(97)01175-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Silicon dioxide films doped with nanocrystallites of CdS with a mean radius value in the range of 20 to 40 Angstrom have been grown using the magnetron rf-sputtering technique. We have studied the combined effects of rf-power deposition, the number of semiconductor chips on the SiO2 target, and post-annealing temperature on the CdS crystal size. The optical transmission spectra display a marked blue shift of the absorption band edge of up to 400 meV which was attributed to quantum size confinement effects. The luminescence spectra show a narrow emission peak tentatively explained as being due to the recombination of electrons on shallow donor levels with confined valence band holes. (C) 1998 Elsevier Science S.A.
引用
收藏
页码:108 / 112
页数:5
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