Effect of thermal stress and short-wavelength visible radiation on phosphor-embedded LED encapsulant degradation

被引:18
作者
Appaiah, Prathika [1 ]
Narendran, Nadarajah [1 ]
Perera, Indika U. [1 ]
Zhu, Yiting [1 ]
Liu, Yi-Wei [1 ]
机构
[1] Rensselaer Polytech Inst, Lighting Res Ctr, Troy, NY USA
关键词
Thermal degradation; Encapsulant; Short-wavelength radiation; White LED; Degradation; Reliability; SOL-GEL METHOD; WHITE LEDS; EPOXY; RELIABILITY;
D O I
10.1016/j.optmat.2015.03.030
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This study evaluated the effects of short-wavelength radiation and thermal stress leading to thermal degradation of an LED encapsulant, which contributes to reduced light output. The effect of light transmission was measured in encapsulant samples with different YAG:Ce phosphor concentrations mixed in epoxy, which were subjected to short-wavelength optical radiation and thermal stress. Encapsulant samples with increasing phosphor concentrations showed lower degradation rates of the encapsulant under thermal stress, while under short-wavelength optical radiation the samples with phosphor showed higher degradation rates. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:6 / 11
页数:6
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