Rapid and facile fabrication of conducting monolayer reduced graphene oxide films by methane plasma-assisted reduction

被引:20
作者
Morikuni, Yuki [1 ]
De Silva, K. Kanishka H. [1 ]
Viswanath, Pamarti [1 ]
Hara, Masanori [1 ]
Yoshimura, Masamichi [1 ]
机构
[1] Toyota Technol Inst, Grad Sch Engn, Tempa Ku, 2-12-1 Hisakata, Nagoya, Aichi 4688511, Japan
关键词
Methane plasma; Lattice defect restoration; Reduced graphene oxide; Monolayer conductive films; Conductive atomic force microscopy; GRAPHITIC STRUCTURE; THERMAL REDUCTION; REPAIR; RESTORATION; HYDRAZINE; SHEETS;
D O I
10.1016/j.apsusc.2021.151022
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this research article, we report a method to fabricate conducting reduced graphene oxide (rGO) monolayer films reduced by methane plasma treatment within few minutes and the nanoscale characterization of local conductivity via conductive atomic force microscopy (C-AFM), realizing their applicability in highly transparent conducting electrodes. Continuous monolayer graphene oxide (GO) films were fabricated by a simple spin-coating method and reduction of oxygen-containing groups with simultaneous lattice defect restoration was done by methane plasma treatment. Current images obtained by C-AFM provide detailed information about the conductivity through the flakes depending on the plasma irradiation time. Moreover, lattice defect restoration was confirmed by the appearance of the G'-band in Raman spectra, which is in correlation with current images, whereas no G'-band or current image was observed in vacuum annealed samples at similar durations in the absence of methane. This rapid and facile method offers a way to fabricate conductive monolayer rGO films by a short-term plasma treatment allowing to utilize low melting point substrates to form flexible conductive graphene-based films.
引用
收藏
页数:9
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共 46 条
[1]   Local conductance measurement of graphene layer using conductive atomic force microscopy [J].
Ahmad, Muneer ;
Han, Sang A. ;
Tien, D. Hoang ;
Jung, Jongwan ;
Seo, Yongho .
JOURNAL OF APPLIED PHYSICS, 2011, 110 (05)
[2]   Enhanced conductivity in graphene layers and at their edges [J].
Banerjee, S ;
Sardar, M ;
Gayathri, N ;
Tyagi, AK ;
Raj, B .
APPLIED PHYSICS LETTERS, 2006, 88 (06)
[3]   Restoration of graphene from graphene oxide by defect repair [J].
Cheng, Meng ;
Yang, Rong ;
Zhang, Lianchang ;
Shi, Zhiwen ;
Yang, Wei ;
Wang, Duoming ;
Xie, Guibai ;
Shi, Dongxia ;
Zhang, Guangyu .
CARBON, 2012, 50 (07) :2581-2587
[4]   Langmuir-Blodgett Assembly of Graphite Oxide Single Layers [J].
Cote, Laura J. ;
Kim, Franklin ;
Huang, Jiaxing .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2009, 131 (03) :1043-1049
[5]   High-Quality Single-Layer Graphene via Reparative Reduction of Graphene Oxide [J].
Dai, Boya ;
Fu, Lei ;
Liao, Lei ;
Liu, Nan ;
Yan, Kai ;
Chen, Yongsheng ;
Liu, Zhongfan .
NANO RESEARCH, 2011, 4 (05) :434-439
[6]   Restoration of the graphitic structure by defect repair during the thermal reduction of graphene oxide [J].
De Silva, K. Kanishka H. ;
Huang, Hsin-Hui ;
Joshi, Rakesh ;
Yoshimura, Masamichi .
CARBON, 2020, 166 :74-90
[7]   Ethanol-assisted restoration of graphitic structure with simultaneous thermal reduction of graphene oxide [J].
De Silva, K. Kanishka H. ;
Huang, Hsin-Hui ;
Suzuki, Seiya ;
Badam, Rajashekar ;
Yoshimura, Masamichi .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2018, 57 (08)
[8]   Progress of reduction of graphene oxide by ascorbic acid [J].
De Silva, K. Kanishka H. ;
Huang, Hsin-Hui ;
Yoshimura, Masamichi .
APPLIED SURFACE SCIENCE, 2018, 447 :338-346
[9]   Graphene oxide in aqueous and nonaqueous media: Dispersion behaviour and solution chemistry [J].
Du, Wencheng ;
Wu, Hanguang ;
Chen, Hongwu ;
Xu, Guochuang ;
Li, Chun .
CARBON, 2020, 158 :568-579
[10]   Wet Chemical Synthesis of Graphene [J].
Eigler, Siegfried ;
Enzelberger-Heim, Michael ;
Grimm, Stefan ;
Hofmann, Philipp ;
Kroener, Wolfgang ;
Geworski, Andreas ;
Dotzer, Christoph ;
Roeckert, Michael ;
Xiao, Jie ;
Papp, Christian ;
Lytken, Ole ;
Steinrueck, Hans-Peter ;
Mueller, Paul ;
Hirsch, Andreas .
ADVANCED MATERIALS, 2013, 25 (26) :3583-3587