Multifrequency Measurements of Dielectric Properties Using a Transmission-Type Overmoded Cylindrical Cavity

被引:9
作者
Cheng, Guoxin [1 ]
Yuan, Chengwei [1 ]
Ma, Xiaoxiong [2 ]
Liu, Lie [1 ]
机构
[1] Natl Univ Def Technol, Coll Optoelect Sci & Engn, Changsha 410073, Hunan, Peoples R China
[2] Hunan Plast Res Inst, Hunan Key Lab Polymer Mat Applicat Technol, Changsha 410001, Hunan, Peoples R China
基金
中国国家自然科学基金;
关键词
Complex permittivity; dielectric materials; multifrequency measurement; resonant cavity; transmission type; COMPLEX PERMITTIVITY MEASUREMENTS; MICROWAVE RESONATORS; MODE;
D O I
10.1109/TMTT.2011.2123105
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Characterization of complex permittivity has been performed using TM0mm modes in an overmoded cylindrical cavity. The Rayleigh-Ritz technique is employed to find a rigorous relationship between the relative permittivity, resonant frequency, and the dimensions of the resonant structure. A functional relationship between the structure's S-parameters and the system's unloaded Q factor is established. Complex permittivities of several materials, including polytetrafluoroethylene, high-density polyethylene, cross-linked polyethylene, and sodium naphthalene treated PTFE, are measured at room temperature. Their accuracy is assessed by comparing the results with those obtained from other well-known techniques. An error analysis is also presented to estimate the errors incurred due to the uncertainties in cavity dimensions, resonant frequency, scattering parameters, and the conductivity of the coating layer. In this measurement, an accuracy of better than +/- 0.5% is attained in measurement of the relative permittivity, while the uncertainty in the measured loss tangent is within a range of +/- 6%. For properly chosen sample dimensions, this presented method is examined to be very useful for measurement of the complex permittivity over the widely used microwave frequency range, such as the L-, S-, C-, and X-bands.
引用
收藏
页码:1408 / 1418
页数:11
相关论文
共 24 条
[1]   IMPROVED TECHNIQUE FOR DETERMINING COMPLEX PERMITTIVITY WITH THE TRANSMISSION REFLECTION METHOD [J].
BAKERJARVIS, J ;
VANZURA, EJ ;
KISSICK, WA .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1990, 38 (08) :1096-1103
[2]   Noniterative stable transmission/reflection method for low-loss material complex permittivity determination [J].
Boughriet, AH ;
Legrand, C ;
Chapoton, A .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1997, 45 (01) :52-57
[3]   DIELECTRIC-PROPERTIES OF POLYMERS AT MICROWAVE-FREQUENCIES - A REVIEW [J].
BUR, AJ .
POLYMER, 1985, 26 (07) :963-977
[4]   A FREE-SPACE METHOD FOR MEASUREMENT OF DIELECTRIC-CONSTANTS AND LOSS TANGENTS AT MICROWAVE-FREQUENCIES [J].
GHODGAONKAR, DK ;
VARADAN, VV ;
VARADAN, VK .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (03) :789-793
[5]   A new technique for measuring the permittivity and loss tangent of cylindrical dielectric rods [J].
Humbert, WR ;
Scott, WR .
IEEE MICROWAVE AND GUIDED WAVE LETTERS, 1996, 6 (07) :262-264
[6]   Q-FACTOR MEASUREMENT WITH A SCALAR NETWORK ANALYZER [J].
KAJFEZ, D .
IEE PROCEEDINGS-MICROWAVES ANTENNAS AND PROPAGATION, 1995, 142 (05) :369-372
[8]  
Kawabata H, 2001, APMC 2001: ASIA-PACIFIC MICROWAVE CONFERENCE, VOLS 1-3, PROCEEDINGS, P1322, DOI 10.1109/APMC.2001.985379
[9]  
Kawabata H., 2006, P EUR MICR C MANCH U, P388, DOI 10.1109/EUMC.2006.281355
[10]   Round robin test on a cavity resonance method to measure complex permittivity of dielectric plates at microwave frequency [J].
Kobayashi, Yoshio ;
Nakayama, Akira .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2006, 13 (04) :751-759