Discard wide-baseline mismatch using contour fragments

被引：1

作者：

Tao, C. ^{[1
]}

Tan, Y. H. ^{[1
]}

Wang, Y. T. ^{[1
]}

Tian, J. W. ^{[1
]}

机构：

[1] Huazhong Univ Sci & Technol, Inst Pattern Recognit & Artificial Intelligence, State Key Lab Multispectral Informat Proc Technol, Wuhan 430074, Peoples R China

来源：

ELECTRONICS LETTERS | 2010年 / 46卷 / 12期

关键词：

D O I：

10.1049/el.2010.1128

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A method to discard wide-baseline mismatches, which is based on the consistence of local contour fragments between two matched regions, is presented. Experimental results show that the proposed approach can efficiently extract high-precision matches from low-precision initial SIFT matches and performs best, or close to best, in comparison with state-of-the-art methods.

引用

页码：834 / U47

页数：2

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