Characterization of the surface changes and the aging effects of low-pressure nitrogen plasma treatment in a polyurethane film

被引：121

作者：

Sanchis, M. R. ^{[2
]}

Calvo, O. ^{[2
]}

Fenollar, O. ^{[1
]}

Garcia, D. ^{[1
]}

Balart, R. ^{[1
]}

机构：

[1] Univ Politecn Valencia, Higher Polytech Sch Alcoy, Dept Mech & Mat Engn, Alicante 03801, Spain

[2] Text Res Inst AITEX, Alicante 03801, Spain

来源：

POLYMER TESTING | 2008年 / 27卷 / 01期

关键词：

surface modification; X-ray photoelectron spectroscopy (XPS); contact angle; atomic force microscopy (AFM); low-pressure plasma; polyurethane film;

D O I：

10.1016/j.polymertesting.2007.09.002

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In this work, low-pressure nitrogen plasma has been used to improve wettability in a polyurethane film. Evaluation of wettability changes has been carried out using contact angle measurements. Furthermore, plasma-treated films have been subjected to air aging to evaluate the extent of hydrophobic recovery. X-ray photoelectron spectroscopy (XPS) has been used to study surface functionalization; surface topography changes related with the etching mechanism have been followed by scanning electron microscopy (SEM), atomic force microscopy (AFM) and weight loss study. The results show a considerable improvement in surface wettability even for short exposure times, as observed by a remarkable decrease in contact angle values. The aging study shows a partial hydrophobic recovery due to the re-arrangement of polar species and migration of low molecular oxidized material (LMWOM). In addition to surface activation, SEM and AFM analyses show slight changes in surface topography as a consequence of the plasma-etching mechanism. (C) 2007 Elsevier Ltd. All rights reserved.

引用

页码：75 / 83

页数：9

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