N-type hydrogenated amorphous silicon oxide containing a microcrystalline silicon phase as an intermediate reflector in silicon thin film solar cells

被引:24
作者
Grundler, Thomas [1 ,2 ]
Lambertz, Andreas [2 ]
Finger, Friedhelm [2 ]
机构
[1] Helmholtz Zentrum Berlin Mat & Energie, Glienicker Str 100, D-14109 Berlin, Germany
[2] Forschungszentrum Julich, IEF 5, D-52425 Julich, Germany
来源
PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 3-4 | 2010年 / 7卷 / 3-4期
关键词
D O I
10.1002/pssc.200982872
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To decrease the extent of degradation of a-Si: H/mu c-Si: H tandem solar cells it is important to reduce the thickness of the a-Si: H component cell. A silicon oxide intermediate reflector between top and bottom cell reflects the light back into the a-Si: H top cell and thus increases its current. For this purpose the reflector material has to fulfill certain optical and electrical requirements. Phosphorous doped silicon oxide films (a-SiOx:H < n >) with a certain volume fraction of microcrystalline silicon (mu cSi:H < n >) are used for this purpose and the trade-off between the material's optical and electrical properties is studied in detail. A suitable intermediate reflector is implemented in a tandem solar cell resulting in an increase in top cell current density by 1.3 mA/cm(2) with similar FF and V-oc compared to cells without intermediate reflector. An efficiency of 11.5 % is achieved at a top cell absorber layer thickness of only 250 nm. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:1085 / 1088
页数:4
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