Dielectric characterization by means of whispering gallery mode resonators

被引:0
|
作者
Fittipaldi, M. [1 ]
Strambini, E. [1 ,2 ]
Martinelli, M. [2 ]
Annino, G. [2 ]
机构
[1] Univ Florence, Dipartimento Chim, INSTM, Via Lastruccia 3, I-50019 Sesto, Fiorentino, Italy
[2] CNR, Ist Proc Chim Fisici, I-56124 Pisa, Italy
关键词
MILLIMETER;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A methodology to characterize the complex dielectric permittivity of low-loss materials at millimeter and submillimeter wavelengths, based on whispering gallery mode dielectric resonators, is presented, together with some illustrative results.
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页数:2
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