In-situ lattice-strain analysis of a ferroelectric thin film under an applied pulse electric field

被引：19

作者：

Sakata, O. ^{[1
,2
]}

Yasui, S. ^{[3
]}

Yamada, T. ^{[3
]}

Yabashi, M. ^{[4
]}

Kimura, S. ^{[1
]}

Funakubo, H. ^{[3
]}

机构：

[1] Japan Synchrotron Radiat Res Inst SPring 8, Sayo, Hyogo 6795198, Japan

[2] JST CREST, Chiyoda Ku, Tokyo 1020075, Japan

[3] Tokyo Inst Technol, Yokohama, Kanagawa 2268502, Japan

[4] RIKEN SPring 8, XFEL Project Head Off, Sayo, Hyogo 6795148, Japan

来源：

SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION | 2010年 / 1234卷

关键词：

in-situ x-ray diffraction; nano-second order time resolution; piezoelectric constant; electrostrictive coefficient; PIEZOELECTRIC PROPERTIES;

D O I：

10.1063/1.3463162

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We developed an in-situ measurement system for characterizing the relationship between ferroelectricity and lattice distortion of a ferroelectric thin film at BL13XU, SPring-8. The dielectric polarization obtained and the lattice strain evaluated provide us with the electrostrictive coefficient of the film. The system for the method consists of a refractive lens for two dimensional micron focusing, ferroelectric characterization system, high-precision four-circle diffractometer, and time-resolved photon counting system. It enables in-situ measurements of the electric polarization of the film and an electric-field-induced strain using nano-second order time-resolved synchrotron diffraction. We applied the method to determining the lattice constant distorted by the electric field and the polarization value of a 410 nm-thick BiFeO3 thin film. The piezoelectric constant d(33) evaluated was about 28 pm/V. The polarization observed allowed us to evaluate an electrostrictive coefficient Q of 1.4 X 10(-2) m(4)/c(2).

引用

页码：151 / +

页数：2

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