Optical Properties and X-ray Absorption Fine Structure Analysis of ZnS:Cu,Cl Thin-Film Phosphors

被引:1
|
作者
Ichino, Kunio [1 ]
Kato, Haruki [1 ]
Sakai, Yuichiro [1 ]
Ohmi, Koutoku [1 ]
Honma, Tetsuo [2 ]
Itoh, Jun-ichi [3 ]
Sasakura, Asuka [3 ]
机构
[1] Tottori Univ, Dept Elect & Informat, Tottori 6808552, Japan
[2] Japan Synchrotron Radiat Res Inst, Sayo, Hyogo 6795198, Japan
[3] Mitsui Min & Smelting Co Ltd, Corp R&D Ctr, Ageo, Saitama 3620021, Japan
基金
日本学术振兴会;
关键词
COPPER LUMINESCENCE; ZNS CRYSTALS; DEGRADATION; MECHANISM; SPECTROSCOPY; SUBSTRATE; EMISSION;
D O I
10.1143/JJAP.49.082602
中图分类号
O59 [应用物理学];
学科分类号
摘要
ZnS Cu,Cl thin-film phosphors have been studied for possible application to resin-free white light-emitting diodes (LEDs) The ZnS Cu,Cl polycrystalline films grown by a molecular-beam deposition technique at relatively high substrate temperatures exhibit strong blue-green photoluminescence (PL) The films with a relatively high (similar to 1%) Cu concentration exhibit an enhanced near-UV excitation band as well as strong PL, making them suitable for excitation by UV LEDs. however, the transmission in the visible spectral range decreases The X-ray absorption fine structure analysis of the phosphor films suggests that Cu atoms substitute for Zn sites at low Cu concentrations, whereas excess Cu atoms exist in a different form, possibly as CuS-like precipitates, at high Cu concentrations The addition of Al donors to the phosphor films enhances the PL intensity and transparency, resulting from a reduction in the amount of the precipitates (C) 2010 The Japan Society of Applied Physics
引用
收藏
页数:6
相关论文
共 50 条
  • [41] Composition analysis of a polymer electrolyte membrane fuel cell microporous layer using scanning transmission X-ray microscopy and near edge X-ray absorption fine structure analysis
    George, Michael G.
    Wang, Jian
    Banerjee, Rupak
    Bazylak, Aimy
    JOURNAL OF POWER SOURCES, 2016, 309 : 254 - 259
  • [42] Forensic Identification of Automobile Window Glass Manufacturers in Japan Based on the Refractive Index, X-ray Fluorescence, and X-ray Absorption Fine Structure
    Funatsuki, Atsushi
    Takaoka, Masaki
    Shiota, Kenji
    Kokubu, Daisuke
    Suzuki, Yasuhiro
    ANALYTICAL SCIENCES, 2016, 32 (02) : 207 - 213
  • [43] An improved laboratory-based x-ray absorption fine structure and x-ray emission spectrometer for analytical applications in materials chemistry research
    Jahrman, Evan P.
    Holden, William M.
    Ditter, Alexander S.
    Mortensen, Devon R.
    Seidler, Gerald T.
    Fister, Timothy T.
    Kozimor, Stosh A.
    Piper, Louis F. J.
    Rana, Jatinkumar
    Hyatt, Neil C.
    Stennett, Martin C.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2019, 90 (02)
  • [44] Extended X-ray Absorption Fine Structure Investigation of Arsenic in HgCdTe: the Effect of the Activation Anneal
    Ballet, P.
    Polge, B.
    Biquard, X.
    Alliot, I.
    JOURNAL OF ELECTRONIC MATERIALS, 2009, 38 (08) : 1726 - 1732
  • [45] X-ray absorption fine structure study of heavily P doped (111) and (001) diamond
    Shikata, Shinichi
    Yamaguchi, Koji
    Fujiwara, Akihiko
    Tamenori, Yusuke
    Yahiro, Jumpei
    Kunisu, Masahiro
    Yamada, Takatoshi
    APPLIED PHYSICS LETTERS, 2017, 110 (07)
  • [46] Neural network based analysis of multimodal bond distributions using extended x-ray absorption fine structure spectra
    Marcella, Nicholas
    Lam, Stephen
    Bryantsev, Vyacheslav S.
    Roy, Santanu
    Frenkel, Anatoly I.
    PHYSICAL REVIEW B, 2024, 109 (10)
  • [47] Extended X-ray absorption fine structure (EXAFS) measurement of Cu metal foil using thermal wave detector: A comparative study
    Kane, S. R.
    Singh, Manvendra
    Satapathy, S.
    Mehata, P. K.
    Jha, P. K.
    Urkude, Rajashri R.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2024, 1060
  • [48] A theoretical study of the near edge X-ray absorption fine structure of amino acids and proteins
    Buckley, Matthew W.
    Besley, Nicholas A.
    CHEMICAL PHYSICS LETTERS, 2011, 501 (4-6) : 540 - 546
  • [49] Probing the Chain and Crystal Lattice Orientation in Polyethylene Thin Films by Near Edge X-ray Absorption Fine Structure (NEXAFS) Spectroscopy
    Wang, Yantian
    Zou, Ying
    Araki, Tohru
    Jan Luening
    Kilcoyne, A. L. D.
    Sokolov, Jonathan
    Ade, Harald
    Rafailovich, Miriam
    MACROMOLECULES, 2010, 43 (19) : 8153 - 8161
  • [50] Thermal and Mechanical Aging of Self-Assembled Monolayers as Studied by Near Edge X-ray Absorption Fine Structure
    Klein, Robert J.
    Fischer, Daniel A.
    Lenhart, Joseph L.
    LANGMUIR, 2011, 27 (20) : 12423 - 12433