Anomalous X-ray diffraction from self-assembled PbSe/PbEuTe quantum dots

被引：3
作者：
Holy, V
Schülli, TU
Lechner, RT
Springholz, G
Bauer, G
机构：
[1] Charles Univ, Dept Phys Elect Struct, CZ-12116 Prague, Czech Republic
[2] CEA, DRFMC, SP2M, F-38054 Grenoble, France
[3] Johannes Kepler Univ, Inst Semicond Phys, A-4040 Linz, Austria
来源：
JOURNAL OF ALLOYS AND COMPOUNDS | 2005年 / 401卷 / 1-2期
基金：
奥地利科学基金会;
关键词：
nanostructures; surfaces and interfaces; semiconductors; X-ray diffraction;
D O I：
10.1016/j.jallcom.2004.11.075
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Anomalous X-ray scattering from self-assembled PbSe quantum dots embedded in Pb1-xEuxTe was used for the study of their structure. The measured reciprocal-space distributions of diffracted intensity were compared with simulations based on kinematical scattering theory and continuum elasticity. From the comparison, the mean chemical composition of the dots and their aspect ratio (height/width) were estimated. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：4 / 10
页数：7
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