Modeling of Partial Shading Tolerance in Micro Concentrator Photovoltaic Modules

被引:0
作者
Moore, James E. [1 ]
Schmieder, Kenneth J.
Wagner, Wolfgang
Lumb, Matthew P.
机构
[1] George Washington Univ, Washington, DC 20053 USA
来源
2019 IEEE 46TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) | 2019年
关键词
D O I
10.1109/pvsc40753.2019.8981354
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Micro-concentrator photovoltaics (mu-CPV) may provide a cost effective means of producing terrestrial solar power with high area efficiency. By printing CPV onto a transparent substrate, a Si back panel can be used to capture the diffuse sunlight component. Models show that efficiencies above 30% can be achieved even under global normal irradiance (GNI) with a 40% diffuse component. Additionally, the power output of existing installations can be boosted by adding a transparent mu-CPV array on top. To further the development of this technology, we have created a model to analyze mu-CPV array reliability under non-ideal conditions. The adverse effects of partial shading on standard large area panels such as crystalline Silicon (c-Si) are well known, but little investigation has been done on the tolerance of the mu-CPV components. In this article a SPICE simulation is used to analyze the effects of partial shading on a mu-CPV module and evaluate various circuit layouts.
引用
收藏
页码:260 / 263
页数:4
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