High-T-c superconductors;
crystal growth;
X-ray diffraction;
magnetisation;
anisotropy;
magnetic measurements;
D O I:
10.1016/S0925-8388(01)01144-6
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
Single crystals of Y1-xDyxNi2B2C were obtained in the wide concentration range (0 <x <0.95). Quality of plate-like crystals was examined by X-ray diffraction and XPS measurements. The superconducting and magnetic properties of the samples were determined by means of magnetisation measurements as a function of temperature and magnetic field. The intrinsic properties of Y1-xDyxNi2B2C superconductors are strongly influenced by the magnetic subsystem. The effect of the 4f moment ordering manifests in the suppression of the diamagnetic signal and the shift of the superconducting transition towards the lower temperatures. In the FC plots paramagnetic magnetisation is observed in the Dy substituted superconductors. The applied magnetic field can induce metamagnetic transition in the Y-Dy magnetic sublattice. A high anisotropy in superconducting as well as magnetic properties of pseudoquaternary Y1-xDyxNi2B2C single crystals is found. (C) 2001 Elsevier Science B.V. All rights reserved.
机构:
DELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDSDELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDS
SIEGRIST, T
ZANDBERGEN, HW
论文数: 0引用数: 0
h-index: 0
机构:
DELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDSDELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDS
ZANDBERGEN, HW
CAVA, RJ
论文数: 0引用数: 0
h-index: 0
机构:
DELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDSDELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDS
CAVA, RJ
KRAJEWSKI, JJ
论文数: 0引用数: 0
h-index: 0
机构:
DELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDSDELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDS
KRAJEWSKI, JJ
PECK, WF
论文数: 0引用数: 0
h-index: 0
机构:
DELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDSDELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDS
机构:
DELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDSDELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDS
SIEGRIST, T
ZANDBERGEN, HW
论文数: 0引用数: 0
h-index: 0
机构:
DELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDSDELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDS
ZANDBERGEN, HW
CAVA, RJ
论文数: 0引用数: 0
h-index: 0
机构:
DELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDSDELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDS
CAVA, RJ
KRAJEWSKI, JJ
论文数: 0引用数: 0
h-index: 0
机构:
DELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDSDELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDS
KRAJEWSKI, JJ
PECK, WF
论文数: 0引用数: 0
h-index: 0
机构:
DELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDSDELFT UNIV TECHNOL,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,2628 AL DELFT,NETHERLANDS