Quantitative Characterization of Defects With Fixed-Delay THz Sensors

被引：2

作者：

Colleoni, Margherita P. M. ^{[1
]}

Angel Baez-Chorro, Miguel ^{[2
]}

Vidal, Borja ^{[2
]}

机构：

[1] Technol Inst Packaging Transport & Logist, Paterna 46980, Spain

[2] Univ Politecn Valencia, Nanophoton Technol Ctr, Valencia 46022, Spain

来源：

IEEE SENSORS LETTERS | 2019年 / 3卷 / 10期

关键词：

Microwave/millimeter wave sensors; nondestructive identification; terahertz (THz); THz technology;

D O I：

10.1109/LSENS.2019.2940087

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The extraction of information from defects in samples made of nonpolar nondispersive dielectrics (such as plastic, ceramic, glass, and composites) using a fast fixed-delay configuration in a THz photoconductive platform is investigated. Experimental results show that information such as changes in the sample profile and void volume can be extracted in a range of defect sizes. This approach can ease THz quality control in certain industries.

引用

页数：4

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