Secondary electron yield of multiwalled carbon nanotubes

被引：20

作者：

Alam, M. K. ^{[1
]}

Yaghoobi, P. ^{[1
]}

Chang, M. ^{[1
]}

Nojeh, A. ^{[1
]}

机构：

[1] Univ British Columbia, Dept Elect & Comp Engn, Vancouver, BC V6T 1Z4, Canada

来源：

APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 26期

基金：

加拿大自然科学与工程研究理事会; 加拿大创新基金会;

关键词：

EMISSION; MICROSCOPY;

D O I：

10.1063/1.3532851

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Secondary electron yield from individual multiwalled carbon nanotubes is investigated for a wide range of primary beam energies (0.5-15 keV). By using a simple experimental procedure under an optical microscope, we make suspended nanotubes, which are free from interaction with the substrate during electron yield measurements. It is found that the secondary electron yield from isolated suspended nanotubes is less than unity and decreases as a function of primary electron energy. (C) 2010 American Institute of Physics. [doi:10.1063/1.3532851]

引用

页数：3

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