EFFECT OF CURVATURE AND ELECTRODE COVERAGE ON THE QUALITY FACTOR OF BICONVEX ALN-ON-SI MEMS RESONATORS

被引:0
作者
Siddiqi, Muhammad Wajih Ullah [1 ]
Tu, Cheng [2 ]
Lee, Joshua E-Y [1 ,3 ]
机构
[1] City Univ Hong Kong, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China
[2] Univ Illinois, Dept Elect & Comp Engn, 1406 W Green St, Urbana, IL 61801 USA
[3] City Univ Hong Kong, State Key Lab Millimeter Waves, Kowloon, Hong Kong, Peoples R China
来源
2017 19TH INTERNATIONAL CONFERENCE ON SOLID-STATE SENSORS, ACTUATORS AND MICROSYSTEMS (TRANSDUCERS) | 2017年
关键词
Piezoelectric-on-silicon; contour mode; resonators; quality factor; anchor loss; GAPS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper analyzes for the first time the effect of incrementally varying the curvature of a MEMS contour mode resonator on its quality factor (Q). The change in curvature is analyzed in terms of the change in width of the acoustic cavity. Our experimental results show that the change in width of the acoustic cavity should be at least half the acoustic wavelength (lambda) of the resonant cavity to achieve optimal and consistent improvement in Q. However, curving beyond lambda drastically reduces coupling while providing little improvement in Q. We also examine the impact of electrode coverage for Q-enhanced biconvex resonators: Narrowing the width of the electrodes tends to increase Q but shortening the length reduces Q slightly.
引用
收藏
页码:98 / 101
页数:4
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