Optimum constant-stress life test plans for Pareto distribution under type-I censoring

被引:32
作者
Ismail, Ali A. [1 ]
Abdel-Ghaly, Abdalla A. [2 ]
El-Khodary, Eman H. [2 ]
机构
[1] King Saud Univ, Coll Sci, Dept Stat & Operat Res, Riyadh 11451, Saudi Arabia
[2] Cairo Univ, Fac Econ & Polit Sci, Dept Stat, Giza, Egypt
关键词
reliability; Pareto distribution; partial acceleration; constant-stress; maximum-likelihood estimation; Fisher information matrix; optimum test plans; type-I censoring; Monte Carlo simulation; OPTIMAL-DESIGN;
D O I
10.1080/00949655.2010.506440
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
The paper considers the case of constant-stress partially accelerated life testing (CSPALT) when two stress levels are involved under type-I censoring. The lifetimes of test items are assumed to follow a two-parameter Pareto lifetime distribution. Maximum-likelihood method is used to estimate the parameters of CSPALT model. Confidence intervals for the model parameters are constructed. Optimum CSPALT plans that determine the best choice of the proportion of test units allocated to each stress are developed. Such optimum test plans minimize the generalized asymptotic variance of the maximum-likelihood estimators of the model parameters. For illustration, Monte Carlo simulation studies are presented.
引用
收藏
页码:1835 / 1845
页数:11
相关论文
共 23 条
[1]  
Abd-Elfattah A.M., 2008, Statistical Methodology, V5, P502, DOI [DOI 10.1016/J.STAMET.2007.12.001, 10.1016/j.stamet.2007.12.001, DOI 10.1016/j.stamet.2007.12.001]
[2]  
Abdel-Ghani M. M., 1998, THESIS CAIRO U EGYPT
[3]  
Aly H., 2008, Far East J. Theor. Stat., V24, P175
[4]  
[Anonymous], 1993, Continuous Univariate Distributions, DOI DOI 10.1016/0167-9473(96)90015-8
[5]  
[Anonymous], 1988, Parameter estimation in reliability and life span models
[6]  
Attia A.F., 1996, PROCEEDING 31 ANN C, P128
[7]  
Bai D.S., 1993, Eng. Optim, V21, P197, DOI DOI 10.1080/03052159308940975
[8]   OPTIMAL-DESIGN OF PARTIALLY ACCELERATED LIFE TESTS FOR THE LOGNORMAL-DISTRIBUTION UNDER TYPE-I CENSORING [J].
BAI, DS ;
CHUNG, SW ;
CHUN, YR .
RELIABILITY ENGINEERING & SYSTEM SAFETY, 1993, 40 (01) :85-92
[9]   OPTIMAL-DESIGN OF PARTIALLY ACCELERATED LIFE TESTS FOR THE EXPONENTIAL-DISTRIBUTION UNDER TYPE-I CENSORING [J].
BAI, DS ;
CHUNG, SW .
IEEE TRANSACTIONS ON RELIABILITY, 1992, 41 (03) :400-406
[10]  
Bain L., 1992, Introduction to Probability and Mathematical Statistics