A rapid analytical method for the specific surface area of amorphous sio2 based on X-Ray diffraction

被引：6
|
作者：
Ke, Xiumei [1 ,2 ]
Wu, Zhenfeng [3 ]
Lin, Junzhi [4 ]
Wang, Fang [3 ]
Li, Pan [1 ]
Xu, Runchun [1 ]
Yang, Ming [3 ]
Han, Li [1 ]
Zhang, Dingkun [1 ]
机构：
[1] Chengdu Univ Tradit Chinese Med, Sch Pharm, State Key Lab Breeding Base Systemat Res Dev & Ut, Chengdu, Peoples R China
[2] Jiujiang Univ, Sch Basic Med Sci, Jiujiang, Peoples R China
[3] Jiangxi Univ Tradit Chinese Med, Sch Pharm, Nanchang, Jiangxi, Peoples R China
[4] Hosp Chengdu Univ Tradit Chinese Med, Cent Lab, Chengdu, Peoples R China
来源：
JOURNAL OF NON-CRYSTALLINE SOLIDS | 2020年 / 531卷
基金：
中国国家自然科学基金;
关键词：
A rapid prediction method; Specific surface area; Amorphous SiO2; X-Ray Diffraction; SCANNING-ELECTRON-MICROSCOPE; FINE SILICA PARTICLES; NANOTECHNOLOGY; EVOLUTION;
D O I：
10.1016/j.jnoncrysol.2019.119841
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
It is a long wait to determine the specific surface area of amorphous silica by traditional nitrogen adsorption-desorption method, even the determination of a single sample will last for a whole day. The present work proposes a rapid method to predict the specific surface area of amorphous SiO2 using the value of 2 theta of X-ray diffraction. Values of BET surface area, Langmuir surface area and 2 theta of fourteen batches of silica were used for modelling with 2 theta as an independent variable while the other two as dependent variables, respectively. Values of additional five patches of samples were used as authentication data predicting BET and Langmuir with 2 theta. The calibration curve with a good linearity was achieved with a coefficient factor of 0.92 between BET and 2 theta, Langmuir and 2 theta. The above results show that XRD is a reliable method for predicting BET and Langmuir specific surface area of amorphous silica.
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页数：6
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