共 26 条
A rapid analytical method for the specific surface area of amorphous sio2 based on X-Ray diffraction
被引:11
作者:
Ke, Xiumei
[1
,2
]
Wu, Zhenfeng
[3
]
Lin, Junzhi
[4
]
Wang, Fang
[3
]
Li, Pan
[1
]
Xu, Runchun
[1
]
Yang, Ming
[3
]
Han, Li
[1
]
Zhang, Dingkun
[1
]
机构:
[1] Chengdu Univ Tradit Chinese Med, Sch Pharm, State Key Lab Breeding Base Systemat Res Dev & Ut, Chengdu, Peoples R China
[2] Jiujiang Univ, Sch Basic Med Sci, Jiujiang, Peoples R China
[3] Jiangxi Univ Tradit Chinese Med, Sch Pharm, Nanchang, Jiangxi, Peoples R China
[4] Hosp Chengdu Univ Tradit Chinese Med, Cent Lab, Chengdu, Peoples R China
基金:
中国国家自然科学基金;
关键词:
A rapid prediction method;
Specific surface area;
Amorphous SiO2;
X-Ray Diffraction;
SCANNING-ELECTRON-MICROSCOPE;
FINE SILICA PARTICLES;
NANOTECHNOLOGY;
EVOLUTION;
D O I:
10.1016/j.jnoncrysol.2019.119841
中图分类号:
TQ174 [陶瓷工业];
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
It is a long wait to determine the specific surface area of amorphous silica by traditional nitrogen adsorption-desorption method, even the determination of a single sample will last for a whole day. The present work proposes a rapid method to predict the specific surface area of amorphous SiO2 using the value of 2 theta of X-ray diffraction. Values of BET surface area, Langmuir surface area and 2 theta of fourteen batches of silica were used for modelling with 2 theta as an independent variable while the other two as dependent variables, respectively. Values of additional five patches of samples were used as authentication data predicting BET and Langmuir with 2 theta. The calibration curve with a good linearity was achieved with a coefficient factor of 0.92 between BET and 2 theta, Langmuir and 2 theta. The above results show that XRD is a reliable method for predicting BET and Langmuir specific surface area of amorphous silica.
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页数:6
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