A rapid analytical method for the specific surface area of amorphous sio2 based on X-Ray diffraction

被引：11

作者：

Ke, Xiumei ^{[1
,2
]}

Wu, Zhenfeng ^{[3
]}

Lin, Junzhi ^{[4
]}

Wang, Fang ^{[3
]}

Li, Pan ^{[1
]}

Xu, Runchun ^{[1
]}

Yang, Ming ^{[3
]}

Han, Li ^{[1
]}

Zhang, Dingkun ^{[1
]}

机构：

[1] Chengdu Univ Tradit Chinese Med, Sch Pharm, State Key Lab Breeding Base Systemat Res Dev & Ut, Chengdu, Peoples R China

[2] Jiujiang Univ, Sch Basic Med Sci, Jiujiang, Peoples R China

[3] Jiangxi Univ Tradit Chinese Med, Sch Pharm, Nanchang, Jiangxi, Peoples R China

[4] Hosp Chengdu Univ Tradit Chinese Med, Cent Lab, Chengdu, Peoples R China

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 2020年 / 531卷

基金：

中国国家自然科学基金;

关键词：

A rapid prediction method; Specific surface area; Amorphous SiO2; X-Ray Diffraction; SCANNING-ELECTRON-MICROSCOPE; FINE SILICA PARTICLES; NANOTECHNOLOGY; EVOLUTION;

D O I：

10.1016/j.jnoncrysol.2019.119841

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

It is a long wait to determine the specific surface area of amorphous silica by traditional nitrogen adsorption-desorption method, even the determination of a single sample will last for a whole day. The present work proposes a rapid method to predict the specific surface area of amorphous SiO2 using the value of 2 theta of X-ray diffraction. Values of BET surface area, Langmuir surface area and 2 theta of fourteen batches of silica were used for modelling with 2 theta as an independent variable while the other two as dependent variables, respectively. Values of additional five patches of samples were used as authentication data predicting BET and Langmuir with 2 theta. The calibration curve with a good linearity was achieved with a coefficient factor of 0.92 between BET and 2 theta, Langmuir and 2 theta. The above results show that XRD is a reliable method for predicting BET and Langmuir specific surface area of amorphous silica.

引用

页数：6

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