The effect of the platinum particle size on the selective catalytic reduction of NOx with C3H6 over Pt-beta has been investigated. The structure sensitivity of the lean deNO(x) reaction towards the platinum phase has been confirmed and a linear correlation between the TOF and the platinum particle size has been derived. Based on our results, it seems that key elements of structure sensitivity in HC-SCR are the NO dissociation on Pt(1 0 0) planes and Pt-O clean-off by the hydrocarbon. These steps are more easily performed on large Pt particles, i.e., in Pt-catalysts with low metal dispersions. On the other hand, the independence of the Pt(1 0 0)/Pt(1 1 1) ratio with particle size explains the similar N-2 selectivity presented along all the samples (similar to35%). (C) 2003 Elsevier Science B.V. All rights reserved.
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DELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDSDELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDS
Creyghton, EJ
vanDuin, ACT
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DELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDSDELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDS
vanDuin, ACT
Jansen, JC
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Jansen, JC
Kooyman, PJ
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Kooyman, PJ
Zandbergen, HW
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DELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDSDELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDS
Zandbergen, HW
vanBekkum, H
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DELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDSDELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDS
vanBekkum, H
[J].
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS,
1996,
92
(22):
: 4637
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4642
机构:
DELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDSDELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDS
Creyghton, EJ
vanDuin, ACT
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DELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDSDELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDS
vanDuin, ACT
Jansen, JC
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DELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDSDELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDS
Jansen, JC
Kooyman, PJ
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DELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDSDELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDS
Kooyman, PJ
Zandbergen, HW
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DELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDSDELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDS
Zandbergen, HW
vanBekkum, H
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DELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDSDELFT UNIV TECHNOL, MAT SCI LAB, NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY, NL-2628 AL DELFT, NETHERLANDS
vanBekkum, H
[J].
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS,
1996,
92
(22):
: 4637
-
4642