Characterization of CMOS photodiodes for image sensors

被引：0
|
作者：
Brouk, I [1 ]
Ezion, A [1 ]
Nemirovsky, Y [1 ]
机构：
[1] Technion Israel Inst Technol, Dept Elect Engn, IL-32000 Haifa, Israel
来源：
ELECTRO-OPTICS AND MICROELECTRONICS, PROCEEDINGS | 2000年 / 14卷
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The results of electro-optical characterization of CMOS photodiodes with different optical window dimensions are presented in this paper.
引用
收藏
页码：225 / 227
页数：3
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