The phase ambiguity in dispersion measurements by white light spectral interferometry

被引:8
作者
Arosa, Yago [1 ]
Lopez Lago, Elena [1 ]
de la Fuente, Raul [1 ]
机构
[1] Univ Santiago de Compostela, Grp Nanomat Foton & Mat Brenda, Dept Fis Aplicada, E-15782 Santiago De Compostela, Spain
关键词
Dispersion; Refractive index; White light; Spectral interferometry; REFRACTIVE-INDEX; INTERFERENCE; THICKNESS; MICHELSON; DOMAIN; BAND;
D O I
10.1016/j.optlastec.2017.03.042
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this work, we address the phase ambiguity in white light spectral interferometry. This ambiguity prevents one from obtaining the refractive index over a broad spectral range with high accuracy. We first determine the error when the refractive index is fitted to a linear combination of power functions. We demonstrate that the error is proportional to wavelength and independent of sample thickness. We show how to reduce the error over the entire spectral band by measuring the spectral phase at the output of the interferometer for some suitable wavelengths as a function of sample orientation. (C) 2017 Elsevier Ltd. All rights reserved.
引用
收藏
页码:23 / 28
页数:6
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