Simulation study of a mixed terminal structure for 4H-SiC merged PiN/Schottky diode

被引:3
作者
Huang Jian-Hua [1 ]
Lu Hong-Liang [1 ]
Zhang Yu-Ming [1 ]
Zhang Yi-Men [1 ]
Tang Xiao-Yan [1 ]
Chen Feng-Ping [1 ]
Song Qing-Wen [1 ]
机构
[1] Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
基金
中国国家自然科学基金;
关键词
4H-SiC; merged PiN/Schottky diode; junction termination technology; breakdown voltage; EDGE TERMINATION; DESIGN;
D O I
10.1088/1674-1056/20/11/118401
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In this paper, a mixed terminal structure for the 4H-SiC merged PiN/Schottky diode ( MPS) is investigated, which is a combination of a field plate, a junction termination extension and floating limiting rings. Optimization is performed on the terminal structure by using the ISE-TCAD. Further analysis shows that this structure can greatly reduce the sensitivity of the breakdown voltage to the doping concentration and can effectively suppress the effect of the interface charge compared with the structure of the junction termination extension. At the same time, the 4H-SiC MPS with this termination structure can reach a high and stable breakdown voltage.
引用
收藏
页数:4
相关论文
共 15 条
[1]   ANALYSIS OF A HIGH-VOLTAGE MERGED P-I-N SCHOTTKY (MPS) RECTIFIER [J].
BALIGA, BJ .
IEEE ELECTRON DEVICE LETTERS, 1987, 8 (09) :407-409
[2]   Study of 4H-SiC junction barrier Schottky diode using field guard ring termination [J].
Chen Feng-Ping ;
Zhang Yu-Ming ;
Lue Hong-Liang ;
Zhang Yi-Men ;
Huang Jian-Hua .
CHINESE PHYSICS B, 2010, 19 (09)
[3]   Simulation research on offset field-plate used as edge termination in 4H-SiC merged PiN-Schottky diodes [J].
Chen Feng-Ping ;
Zhang Yu-Ming ;
Zhang Yi-Men ;
Lue Hong-Liang ;
Song Qing-Wen .
CHINESE PHYSICS B, 2010, 19 (04)
[4]  
DAVID CS, 2000, SOLID STATE ELECT, V44, P1367
[5]  
DAVID CS, 2001, SOLID STATE ELECT, V45, P1659
[6]  
DAVID CS, 2001, MATER SCI FORUM, V353, P687
[7]  
*DESSIS ISE, 2D SEM DEV SIM VERS
[8]   Silicon carbide benefits and advantages for power electronics circuits and systems [J].
Elasser, A ;
Chow, TP .
PROCEEDINGS OF THE IEEE, 2002, 90 (06) :969-986
[9]  
Kinoshita K, 2002, PROCEEDINGS OF THE 14TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, P253
[10]  
Miao Yong-bin, 2004, Microelectronics, V34, P116