Surface science issues in plasma etching

被引:38
作者
Oehrlein, GS [1 ]
Doemling, MF [1 ]
Kastenmeier, BEE [1 ]
Matsuo, PJ [1 ]
Rueger, NR [1 ]
Schaepkens, M [1 ]
Standaert, TEFM [1 ]
机构
[1] SUNY Albany, Albany, NY 12222 USA
关键词
D O I
10.1147/rd.431.0181
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Pattern transfer by plasma-based etching is one of several key processes required for fabricating silicon-based integrated circuits. We present a brief review of elementary plasma-etching processes on surfaces and within integrated-circuit microstructures-and an overview of recent work in our laboratory on plasma-etching aspects of the formation of self-aligned contacts to a polysilicon layer through a SiO2 layer and a SI3N4 etch-stop layer. The work illustrates the richness of associated surface science issues that must be understood and controlled in order to most effectively achieve plasma-based pattern transfer.
引用
收藏
页码:181 / 197
页数:17
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