Built-In Self-Test for Multipliers in Altera Cyclone II Field Programmable Gate Arrays

被引：0

作者：

Lusco, Michael A. ^{[1
]}

Dailey, Justin L. ^{[1
]}

Stroud, Charles E. ^{[1
]}

机构：

[1] Auburn Univ, Dept Elect & Comp Engn, Auburn, AL 36849 USA

来源：

PROCEEDINGS SSST 2011: 43RD IEEE SOUTHEASTERN SYMPOSIUM ON SYSTEM THEORY | 2011年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes a Built-In Self-Test (BIST) approach designed to verify the integrity of the embedded multiplier cores in Altera Cyclone II Field Programmable Gate Arrays (FPGAs). This approach uses an architecture independent test algorithm implemented with parameterized VHDL to support all FPGAs in the Cyclone II family. The BIST is capable of detecting faults within all of the multiplier's modes of operation in three downloads and can identify the location of faulty multiplier(s). (1)

引用

页码：214 / 219

页数：6

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