Gaussian distribution in current-conduction mechanism of (Ni/Pt) Schottky contacts on wide bandgap AlInGaN quaternary alloy

被引:4
作者
Arslan, Engin [1 ,2 ]
Altindal, Semsettin [3 ]
Ural, Sertac [2 ]
Kayal, Omer Ahmet [2 ]
Ozturk, Mustafa [2 ]
Ozbay, Ekmel [2 ,4 ]
机构
[1] Antalya Bilim Univ, Dept Elect & Elect Engn, TR-07190 Antalya, Turkey
[2] Bilkent Univ, Nanotechnol Res Ctr NANOTAM, TR-06800 Ankara, Turkey
[3] Gazi Univ, Dept Phys, Fac Sci, TR-06500 Ankara, Turkey
[4] Bilkent Univ, Elect & Elect Engn, TR-06800 Ankara, Turkey
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2018年 / 36卷 / 06期
关键词
BARRIER HEIGHTS; TEMPERATURE-DEPENDENCE; ELECTRICAL-PROPERTIES; DIODE PARAMETERS; N-GAN; TRANSPORT; VOLTAGE; INHOMOGENEITIES; ALGAN/GAN; METAL;
D O I
10.1116/1.5045259
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The current-conduction mechanisms of the as-deposited and annealed at 450 degrees C (Ni/Pt) Schottky contacts on AlInGaN quaternary alloy have been investigated in the temperature range of 80-320 K. The zero-bias barrier height (BH) (Phi(B0)) and ideality factor (n) of them were evaluated using thermionic emission (TE) theory. The Phi(B0) and n values calculated from the I-V characteristics show a strong temperature dependence. Such behavior of Phi(B0) and n is attributed to Schottky barrier inhomogeneities. Therefore, both the Phi(B0) vs n and Phi(B0) vs q/2kT plots were drawn to obtain evidence on the Gaussian distribution (GD) of the barrier height at the metal/semiconductor interface. These plots show two different linear parts at low and intermediate temperatures for as-deposited and annealed Schottky contacts. Thus, the mean value of Phi(B0) and standard deviation (sigma(0)) was calculated from the linear parts of the Phi(B0) vs q/kT plots for both samples. The values of the effective Richardson constant (A*) and mean BH were obtained from the modified Richardson plots which included the effect of barrier inhomogeneity. These values of Richardson constant and barrier height for as-deposited contacts were found to be 19.9 A cm(-2) K-2 and 0.59 eV, respectively, at low temperature, but 43.3 A cm(-2) K-2 and 1.32 eV, respectively, at intermediate temperatures. These values of Richardson constant and barrier height for annealed contacts were found to be 19.6 A cm(-2) K-2 and 0.37 eV, respectively, at low temperature, but 42.9 A cm(-2) K-2 and 1.54 eV, respectively, at intermediate temperatures. It is clear that the value of the Richardson constant obtained for as-deposited and annealed samples by using double-GD for intermediate temperatures is close to the theoretical value of AlInGaN (=44.7 A cm(-2) K-2). Therefore, I-V-T characteristics for the as-deposited and annealed Schottky contacts in the temperature range of 80-320 K can be successfully explained based on TE theory with double-GD of the BHs. Published by the AVS.
引用
收藏
页数:10
相关论文
共 46 条
[1]   Review of GaN-based devices for terahertz operation [J].
Ahi, Kiarash .
OPTICAL ENGINEERING, 2017, 56 (09)
[2]   Tunneling current via dislocations in Schottky diodes on AlInN/AlN/GaN heterostructures [J].
Arslan, Engin ;
Altindal, Semsettin ;
Ozcelik, Suleyman ;
Ozbay, Ekmel .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2009, 24 (07)
[3]   Dislocation-governed current-transport mechanism in (Ni/Au)-AlGaN/AlN/GaN heterostructures [J].
Arslan, Engin ;
Altindal, Semsettin ;
Oezcelik, Sueleyman ;
Ozbay, Ekmel .
JOURNAL OF APPLIED PHYSICS, 2009, 105 (02)
[4]   GENERALIZED NORDE PLOT INCLUDING DETERMINATION OF THE IDEALITY FACTOR [J].
BOHLIN, KE .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (03) :1223-1224
[5]   Evidence for the double distribution of barrier heights in Pd2Si/n-Si Schottky diodes from I-V-T measurements [J].
Chand, S ;
Kumar, J .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1996, 11 (08) :1203-1208
[6]   EXTRACTION OF SCHOTTKY DIODE PARAMETERS FROM FORWARD CURRENT-VOLTAGE CHARACTERISTICS [J].
CHEUNG, SK ;
CHEUNG, NW .
APPLIED PHYSICS LETTERS, 1986, 49 (02) :85-87
[7]   The investigation of the electrical properties of Fe3O4/n-Si heterojunctions in a wide temperature range [J].
Deniz, Ali Riza ;
Caldiran, Zakir ;
Metin, Onder ;
Meral, Kadem ;
Aydogan, Sakir .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2016, 473 :172-181
[8]   Investigation of significantly high barrier height in Cu/GaN Schottky diode [J].
Garg, Manjari ;
Kumar, Ashutosh ;
Nagarajan, S. ;
Sopanen, M. ;
Singh, R. .
AIP ADVANCES, 2016, 6 (01)
[9]   Double exponential I-V characteristics and double Gaussian distribution of barrier heights in (Au/Ti)/Al2O3/n-GaAs (MIS)type Schottky barrier diodes in wide temperature range [J].
Guclu, Cigdem S. ;
Ozdemir, Ahmet Faruk ;
Altindal, Semsettin .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2016, 122 (12)
[10]   Quaternary InAlGaN-based high-efficiency ultraviolet light-emitting diodes [J].
Hirayama, H .
JOURNAL OF APPLIED PHYSICS, 2005, 97 (09)