Crystal structure and exchange bias of Ni-Mn-based films

被引:6
作者
Vas'kovskiy, V. O. [1 ,2 ]
Moskalev, M. E. [1 ]
Lepalovskij, V. N. [1 ]
Svalov, A. V. [1 ,3 ]
Larranaga, A. [4 ]
Balymov, K. G. [1 ]
Kulesh, N. A. [1 ]
机构
[1] Ural Fed Univ, Dept Magnetism & Magnet Nanomat, Ekaterinburg 620002, Russia
[2] Russian Acad Sci, Inst Met Phys, Ural Branch, Ekaterinburg 620108, Russia
[3] Univ Pais Vasco UPV EHU, Dept Elect & Elect, Bilbao 48080, Spain
[4] Univ Pais Vasco UPV EHU, Serv Gen Invest, SGIker, Bilbao 48080, Spain
基金
俄罗斯科学基金会;
关键词
Anisotropy; Magnetic films and multilayers; Surfaces and interfaces; Thin films; Phase transitions; X-ray diffraction; SPIN VALVES; NIMN/NIFE; PHASE; FIELD; FEMN;
D O I
10.1016/j.jallcom.2018.11.016
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Crystal structure and hysteresis properties of Ni-Mn/FeNi-based films are studied with respect to the composition of the Ni-Mn layer, annealing conditions, temperature, and the presence of an auxiliary layer. The exchange bias is confirmed to originate from the pinning effect of the antiferromagnetic gamma-NiMn (Al fcc) or theta-NiMn (L1(0) fct) phases formed in the Ni-Mn layer through the epitaxial growth on the seed layer or due to the annealing, respectively. The composition range of Ni-Mn and annealing temperatures providing the formation of the antiferromagnetic phases are determined, as well as their influence on temperature dependences of the exchange bias field and coercivity of the FeNi layer. (C) 2018 Elsevier B.V. All rights reserved.
引用
收藏
页码:264 / 270
页数:7
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