Tip-modulation scanned gate microscopy

被引：20

作者：

Wilson, Neil R. ^{[1
]}

Cobden, David H. ^{[2
]}

机构：

[1] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England

[2] Univ Washington, Dept Phys, Seattle, WA 98195 USA

来源：

NANO LETTERS | 2008年 / 8卷 / 08期

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

10.1021/nl080488i

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We introduce a technique that improves the sensitivity and resolution and eliminates the nonlocal background of scanned gate microscopy (SGM). In conventional SGM, a voltage bias is applied to the atomic force microscope tip and the sample conductance is measured as the tip is scanned. In the new technique, which we call tip-modulation SGM (tmSGM), the biased tip is oscillated and the induced oscillation of the sample conductance is measured. Applied to single-walled carbon nanotube network devices, tmSGM gives sharp, low-noise and background-free images.

引用

页码：2161 / 2165

页数：5

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