Measurement of PCB Surface Finishes for Substrate Characterization up to 67 GHz

被引：0

作者：

Seiler, Patrick ^{[1
]}

Plettemeier, Dirk ^{[1
]}

机构：

[1] Tech Univ Dresden, Chair RF & Photon Engn, SFB 912 HAEC, Dresden, Germany

来源：

2018 IEEE ANTENNAS AND PROPAGATION SOCIETY INTERNATIONAL SYMPOSIUM ON ANTENNAS AND PROPAGATION & USNC/URSI NATIONAL RADIO SCIENCE MEETING | 2018年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, different surface finish technologies for PCB are investigated by measurement up to 67 GHz. As has been shown in previous publications, S-Parameter measurements of planar transmission lines can be used to characterize the permittivity of the underlying planar substrate. Especially nickel present in the surface finish is suspected to have an influence on the substrate characterization, since the frequency-dependent permeability of nickel is usually not accounted for during permittivity calculation. The commercially available and widely used surface finish technologies ENIG, EPIG, ISIG and coverlay are characterized in terms of substrate permittivity and overall loss and compared against each other and a copper only surface for reference. The influence of nickel is extracted and modelled into an effective permeability.

引用

页码：1059 / 1060

页数：2