Vibrational modes and changing molecular conformation of perfluororubrene in thin films and solution

被引：5

作者：

Anger, F. ^{[1
]}

Scholz, R. ^{[2
]}

Gerlach, A. ^{[1
]}

Schreiber, F. ^{[1
]}

机构：

[1] Univ Tubingen, Inst Angew Phys, D-72076 Tubingen, Germany

[2] Tech Univ Dresden, Inst Angew Photophys, D-01069 Dresden, Germany

来源：

JOURNAL OF CHEMICAL PHYSICS | 2015年 / 142卷 / 22期

关键词：

SELF-ASSEMBLED MONOLAYERS; CHARGE-TRANSPORT; INDUCED CRYSTALLIZATION; ORGANIC SEMICONDUCTORS; EXCITON DIFFUSION; RAMAN-SPECTRA; RUBRENE FILMS; GROWTH; CRYSTAL; PLANAR;

D O I：

10.1063/1.4922052

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We investigate the vibrational properties of perfluororubrene (PF-RUB) in thin films on silicon wafers with a native oxide layer as well as on silicon wafers covered with a self-assembled monolayer and in dichloromethane solution. In comparison with computed Raman and IR spectra, we can assign the molecular modes and identify two molecular conformations with twisted and planar tetracene backbones of the molecule. Moreover, we employ Raman imaging techniques to study the morphology and distribution of the molecular conformation in PF-RUB thin films. (C) 2015 AIP Publishing LLC.

引用

页数：9

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