Epitaxial high saturation magnetization FeN thin films on Fe(001) seeded GaAs(001) single crystal wafer using facing target sputterings

被引:21
作者
Ji, Nian
Wu, Yiming
Wang, Jian-Ping [1 ]
机构
[1] Univ Minnesota, Ctr Micromagnet & Informat Technol MINT, Minneapolis, MN 55455 USA
关键词
FE16N2; FILMS; MOMENT;
D O I
10.1063/1.3565403
中图分类号
O59 [应用物理学];
学科分类号
摘要
It was demonstrated that Fe-N martensite (alpha') films were grown epitaxially on Fe(001) seeded GaAs(001) single crystal wafer by using a facing target sputtering method. X-ray diffraction pattern implies an increasing c lattice constant as the N concentration increases in the films. Partially ordered Fe16N2 films were synthesized after in situ post-annealing the as-sputtered samples with pure Fe8N phase. Multiple characterization techniques including XRD, XRR, TEM, and AES were used to determine the sample structure. The saturation magnetization of films with pure Fe8N phase measured by VSM was evaluated in the range of 2.0-2.2 T. The post annealed films show systematic and dramatic increase on the saturation magnetization, which possess an average value of 2.6 T. These observations support the existence of giant saturation magnetization in alpha ''-Fe16N2 phase that is consistent with a recent proposed cluster-atom model and the first principles calculation [N. Ji, X. Q. Liu, and J. P. Wang, New J. Phys. 12 063032 (2010)]. (C) 2011 American Institute of Physics. [doi:10.1063/1.3565403]
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页数:3
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