Analysis of On-Chip Digital Noise Coupling Path for Wireless Communication IC Test Chip

被引：0

作者：

Tanaka, Satoshi ^{[1
]}

Fan, Peng ^{[1
]}

Ma, Jingyan ^{[1
]}

Aoki, Hanae ^{[1
]}

Yamaguchi, Masahiro ^{[1
]}

Nagata, Makoto ^{[2
]}

Muroga, Sho ^{[3
]}

机构：

[1] Tohoku Univ, Dept Elect Engn, Sendai, Miyagi, Japan

[2] Kobe Univ, Grad Sch Syst Informat, Kobe, Hyogo, Japan

[3] Toyota Coll, Natl Inst Technol, Dept Elect & Elect Engn, Toyota, Japan

来源：

2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits | 2015年

关键词：

wireless communication; RF IC; digital noise; magnetic thin film; noise suppressor; conduction noise; FILMS; ANISOTROPY;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In-band spurious tones of a LTE-class radio frequency integrated circuit (RFIC) receiver test element group (TEG) chip was studied in order to evaluate the degree of noise suppression by means of soft magnetic thin film. A 2-mu m-thick crossed anisotropy multilayered Co-Zr-Nb film was appllied onto the passivation layer of TEG chip. The in-band spurious was suppressed by 10 dB while it had no influence upon wanted signal. A magnetic near field map measured in the 2.1 GHz range indicated several noise coupling paths on chip, which were compared with the chip layout design to estimate victim wires. EM simulation model in connection with circuit simulation is carefully constructed. RF control wirings were most responsible wires than other wires and air couplings. EM simulation predicted the magnetic film should suppress noise by the maximum of 33 dB while it was 10 dB experimentally because of Si substrate coupling and board coupling.

引用

页码：216 / 221

页数：6

共 14 条

[1] Azuma N, 2013, 2013 9TH INTERNATIONAL WORKSHOP ON ELECTROMAGNETIC COMPATIBILITY OF INTEGRATED CIRCUITS (EMC COMPO 2013), P42, DOI 10.1109/EMCCompo.2013.6735170
[2] Azuma N., 2013, P IEEE INT TEST C SE
[3] HARDIN KB, 1994, 1994 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - COMPATIBILITY IN THE LOOP, P227, DOI 10.1109/ISEMC.1994.385656
[4] Substrate crosstalk in biCMOS mixed mode integrated circuits
Joardar, K
[J]. SOLID-STATE ELECTRONICS, 1996, 39 (04) : 511 - 516
[5] Measurements and analysis of PLL jitter caused by digital switching noise
Larsson, P
[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2001, 36 (07) : 1113 - 1119
[6] MERRILL RB, 1994, INTERNATIONAL ELECTRON DEVICES MEETING 1994 - IEDM TECHNICAL DIGEST, P433, DOI 10.1109/IEDM.1994.383375
[7] CHARACTERISTICS OF A NEW ISOLATED P-WELL STRUCTURE USING THIN EPITAXY OVER THE BURIED LAYER AND TRENCH ISOLATION
OKAZAKI, Y
KOBAYASHI, T
KONAKA, S
MORIMOTO, T
TAKAHASHI, M
IMAI, K
KADO, Y
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1992, 39 (12) : 2758 - 2764
[8] Induced magnetic anisotropy in Co-TM-Zr (TM=Nb, Ta, Mo, W, and Ni) amorphous sputtered films
Otomo, S
[J]. JOURNAL OF THE JAPAN INSTITUTE OF METALS, 1996, 60 (05) : 529 - 536
[9] INITIAL PERMEABILITY OF AMORPHOUS SINGLE AND MULTILAYERED FILMS
SHIMADA, Y
[J]. IEEE TRANSACTIONS ON MAGNETICS, 1986, 22 (02) : 89 - 92
[10] AMORPHOUS CO-METAL FILMS PRODUCED BY SPUTTERING
SHIMADA, Y
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 83 (01): : 255 - 261

← 1 2 →