Structural Test Coverage Criteria for Deep Neural Networks

被引:49
作者
Sun, Youcheng [1 ]
Huang, Xiaowei [2 ]
Kroening, Daniel [3 ]
Sharp, James [4 ]
Hill, Matthew [4 ]
Ashmore, Rob [4 ]
机构
[1] Queens Univ Belfast, 18 Malone Rd, Belfast BT9 6RT, Antrim, North Ireland
[2] Univ Liverpool, Ashton St, Liverpool L69 3BX, Merseyside, England
[3] Univ Oxford, Wolfson Bldg,Parks Rd, Oxford OX1 3QD, England
[4] Def Sci & Technol Lab, Salisbury, Wilts, England
基金
英国工程与自然科学研究理事会;
关键词
Neural networks; test criteria; test case generation;
D O I
10.1145/3358233
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Deep neural networks (DNNs) have a wide range of applications, and software employing them must be thoroughly tested, especially in safety-critical domains. However, traditional software test coverage metrics cannot be applied directly to DNNs. In this paper, inspired by the MC/DC coverage criterion, we propose a family of four novel test coverage criteria that are tailored to structural features of DNNs and their semantics. We validate the criteria by demonstrating that test inputs that are generated with guidance by our proposed coverage criteria are able to capture undesired behaviours in a DNN. Test cases are generated using a symbolic approach and a gradient-based heuristic search. By comparing them with existing methods, we show that our criteria achieve a balance between their ability to find bugs (proxied using adversarial examples and correlation with functional coverage) and the computational cost of test input generation. Our experiments are conducted on state-of-the-art DNNs obtained using popular open source datasets, including MNIST, CIFAR-10 and ImageNet.
引用
收藏
页数:23
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