X-ray resonant magnetic scattering study of magnetization reversals in a nanoscale spin-valve array

被引：7
|
作者：
Lee, Dong Ryeol [1 ]
Freeland, John W. [2 ]
Choi, Yongseong [3 ]
Srajer, George [2 ]
Metlushko, Vitali [4 ]
Ilic, Bojan [5 ]
机构：
[1] Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang 790784, South Korea
[2] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
[3] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
[4] Univ Illinois Chicago, Dept Elect & Comp Engn, Chicago, IL 60607 USA
[5] Cornell Univ, Cornell Nanofabric Facil, Ithaca, NY 14853 USA
来源：
PHYSICAL REVIEW B | 2007年 / 76卷 / 14期
关键词：
D O I：
10.1103/PhysRevB.76.144425
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We present an x-ray resonant magnetic scattering study that uses the periodicity of a patterned array of trilayer (Co/Cu/NiFe) elements to determine not only layer-dependent magnetic hysteresis, but, more importantly, to extract the magnetization reversal in different sections of the picture-frame-shaped structure. Spatially resolved and layer-resolved magnetization measurements have revealed that magnetic switching mechanism is very distinct in different regions of the structure and results from a balancing of the shape anisotropy and strong interlayer dipolar coupling. These results demonstrate how spatially averaged measurements are not sufficient to resolve the nature of the reversal mechanism within the structure.
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页数：5
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