Response to "Comment on 'Nanometer resolution piezoreponse force microscopy to study deep submicron ferroelectric and ferroelastic domains' " [Appl. Phys. Lett. 97, 046101 (2010)]

被引:0
作者
Durkan, C. [1 ]
Chu, D. P. [2 ]
Ivry, Y. [1 ]
机构
[1] Univ Cambridge, Cambridge CB3 0FF, England
[2] Univ Cambridge, Ctr Adv Photon & Elect, Cambridge CB3 0FA, England
关键词
electric domains; ferroelasticity; lead compounds; piezoelectricity; sol-gel processing;
D O I
10.1063/1.3467006
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页数:1
相关论文
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