Time truncated life tests for new attribute sampling inspection plan and its applications

In this article, a new approach of modified attribute chain sampling inspection plan for time-truncated life test is suggested when lifetime of items follows the generalized exponential distribution. A brief discussion about the generalized exponential distribution is provided. Also, plan parameters are determined based on two points approach: acceptable quality level and limiting quality level. Trend of the sample sizes for each of the considered values of shape parameter are explained in details. Also, plan parameters are determined in case of exponential distribution which is a special case of generalized exponential distribution. Applications of proposed attribute sampling inspection plan have been shown through the real data sets. This study contributes to the development of acceptance sampling inspection plan under the time truncated scheme and in a nutshell, no one used this presented methodology of modified attribute chain sampling inspection plan for generalized exponential distribution. [GRAPHICS]