Multifrequency channel microwave reflectometer with frequency hopping operation for density fluctuation measurements in Large Helical Device

被引：9

作者：

Tokuzawa, T. ^{[1
]}

Ejiri, A. ^{[2
]}

Kawahata, K. ^{[1
]}

机构：

[1] Natl Inst Nat Sci, Natl Inst Fus Sci, Toki, Gifu 5095292, Japan

[2] Univ Tokyo, Grad Sch Frontier Sci, Kashiwa, Chiba 2778561, Japan

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 10期

关键词：

ASDEX UPGRADE; PROFILE; JET; LHD;

D O I：

10.1063/1.3478747

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In order to measure the internal structure of density fluctuations using a microwave reflectometer, the broadband frequency tunable system, which has the ability of fast and stable hopping operation, has been improved in the Large Helical Device. Simultaneous multipoint measurement is the key issue of this development. For accurate phase measurement, the system utilizes a single sideband modulation technique. Currently, a dual channel heterodyne frequency hopping reflectometer system has been constructed and applied to the Alfven eigenmode measurements. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3478747]

引用

页数：4

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